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With our tools you can probe the structure and make-up of a material using a variety of techniques.
Our X-ray diffractometers will help you determine the crystal structure of materials ranging from ceramics to polymers.
Atomic force microscope
We have tools to help you map the surface topology with nanometer resolution.
Profilometry and elliposmetry
Want to measure film thickneses? We have advanced tools to help.
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Our flexible operations model enables academic and industry users to solve problems at any scale.