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4D LABS has extensive capabilities to determine the composition of materials and devices.
X-ray Fluorescence spectrometer
The XRF is capable of fast quantitative analysis with high accuracy and a low limit of detection (i.e., sub ppm level detection limit). It is also capable of point or mapping analysis at a spatial resolution of 500 µm.
X-ray photoelectron spectroscopy system
Our x-ray photoelectron spectroscopy system is used to gain a detailed understanding of the surface of a material.
Laser ablation ICP-MS
We are capable of performing laser ablation inductively coupled plasma mass spectrometry to determine the trace elemental composition of solution and solids down to parts-per-trillion levels.
The elemental analysis capabilities of our electron microscopes provide the ability to map elements on a material with nanometer precision.