Composition Analysis

X-ray Fluorescence spectrometer

The XRF is capable of fast quantitative analysis with high accuracy and a low limit of detection (i.e., sub ppm level detection limit). It is also capable of point or mapping analysis at a spatial resolution of 500 µm.

X-ray photoelectron spectroscopy system

Our x-ray photoelectron spectroscopy system is used to gain a detailed understanding of the surface of a material.

Laser ablation ICP-MS

We are capable of performing laser ablation inductively coupled plasma mass spectrometry to determine the trace elemental composition of solution and solids down to parts-per-trillion levels.

Electron microscopes

The elemental analysis capabilities of our electron microscopes provide the ability to map elements on a material with nanometer precision.