Electron Microscopy

4D LABS has several advanced electron microscopes for structural and composition analysis, allowing users to perform high-quality elemental mapping, cross-section analysis and ion beam patterning.

Transmission Microscope Features

  • 0.16nm resolution
  • High-speed elemental analysis
  • 3D data collection and reconstruction
  • Cryo modes

Scanning Electron Microscope Features

  • Sub-nm resolution
  • Elemental analysis
  • Ion beam milling
  • Cryo capabilities
  • Environmental SEM (high pressure, high temperature, humidity control)

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Our flexible operations model enables academic and industry users to solve problems at any scale.

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