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XPS, AES, ISS, SEM
- XPS: X-ray Photoelectron Spectroscopy, angle-resolved XPS, ion etching for surface cleaning and depth profiling with XPS
- XPM: X-ray Photoelectron Microscopy
- AES: Auger Electron Spectrometry
- SAM: Scanning Auger Microscopy
- SEM: Scanning Electron Microscopy
- ISS: Ion Scattering Spectroscopy
- SIMS: Secondary Ion Mass Spectrometry
- Heating and cooling stage (-160 – 600 °C)
Tool Specs
Manufacturer | Kratos Analytical |
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Model | Axis Ultra DLD |
Location | 6140 |
Related Documents | Standard Operating Procedure |
Contact | info@4dlabs.ca |
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