Structural Analysis
With our tools you can probe the structure and make-up of a material using a variety of techniques.
X-Ray Diffractometry
Our X-ray diffractometers will help you determine the crystal structure of materials ranging from ceramics to polymers.
Small Angle X-ray Scattering (SAXS)
SAXS is a powerful technique for characterizing nanoscale structures (1–100 nm) in materials, providing insights into their size, shape, and internal organization.
Atomic Force Microscope
We have tools to help you map the surface topology with nanometer resolution.
Profilometry and Elliposmetry
Want to measure film thicknesses? We have advanced tools to help.
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Our flexible operations model enables academic and industry users to solve problems at any scale.