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Electron Microscopy
4D LABS has several advanced electron microscopes for structural and composition analysis, allowing users to perform high-quality elemental mapping, cross-section analysis and ion beam patterning.
Transmission Microscope Features
- 0.16nm resolution
- High-speed elemental analysis
- 3D data collection and reconstruction
- Cryo modes
Scanning Electron Microscope Features
- Sub-nm resolution
- Elemental analysis
- Ion beam milling
- Cryo capabilities
- Environmental SEM (high pressure, high temperature, humidity control)
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Our flexible operations model enables academic and industry users to solve problems at any scale.