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X-Ray Fluorescence (XRF)
The Rigaku Primus IV system is a high throughput Wavelength-Dispersive X-Ray Fluorescence (WDXRF) spectrometer capable of fast standard-less analysis, high accuracy and low limit of detection quantitative analysis (i.e., sub ppm level detection limit). It is also capable of point or mapping analysis at a spatial resolution of 500 µm.
To achieve the best detection limit, non-volatile samples are analyzed under vacuum. Apart from analyzing solids (i.e., metals, alloys, fused beads, pressed pellets, and loose powder samples), this instrument, with the proper sample preparation, is also capable of analyzing liquid samples, gels, and paste under a helium atmosphere.
The XRF has a 4 kW Rh X-ray source with an output of 60 kV and 150 mA. The sampling area is modulated by 6 diaphragms: 35 mm, 30 mm, 20 mm, 10 mm, 1 mm and 0.5 mm, respectively. X-ray radiations are diffracted off of the analyzing crystal, which this instrument has 8, separating the radiations based on their energies. This instrument is equipped with crystals capable of analyzing elements ranging from B to Cm.
This instrument consists of an automated sample chuck and an automatic sample changer with a capacity to host up to 48 samples in a single session.
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