XRD 2 - Bruker

• High resolution powder diffraction
• Powder and thin film samples
• Thermal/vacuum stage capable of heating samples up to 1200°C
• Independent Theta & 2-Theta control
• Multichannel silicon strip detector
• Goebel mirror for parallel x-ray beam
• Low angle measurements down to 2°
• Capillary sample holder for liquid samples
   
  

Tool Specs