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Reflectometer
- Measurement of thickness and refractive index of a wide range of film thicknesses (3 nm < t < 250 μm)
- Acquisition of K (extinction coefficient) and N (reflectivity index) for dielectric materials
Tool Specs
| Manufacturer | Filmetrics |
|---|---|
| Model | F-20 UVX |
| Typical Application | Film thickness analysis |
| Location | 6060.2 |
| Related Documents | |
| Training Contact | info@4dlabs.ca |
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