Atomic force microscope

High resolution Atomic Force microscope supporting a wide range of applications.

Scanning modes include:

• Contact
• Tapping (air)
• Non-contact
• Lateral force microscopy
• Electric force microscopy
• Piezoresponse force microscopy
• Conductive AFM
• Scanning Tunneling Microscopy
• Kelvin Probe Force spectroscopy

Key specifications include:

• <35 pm Z noise
• <150 pm XY noise
• 90 um x 90 um XY scan range
• 10 um Z scan range

Additional features include:

• 200 mm motorized position stage
• -35 °C - 250 °C sample temperature control
• capable of scanning in fluid

Tool Specs