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Atomic force microscope
High resolution Atomic Force microscope supporting a wide range of applications.
Scanning modes include:
- Contact
- Tapping (air)
- Non-contact
- Lateral force microscopy
- Electric force microscopy
- Piezoresponse force microscopy
- Conductive AFM
- Scanning Tunneling Microscopy
- Kelvin Probe Force spectroscopy
Key specifications include:
- <35 pm Z noise
- <150 pm XY noise
- 90 um x 90 um XY scan range
- 10 um Z scan range
Additional features include:
- 200 mm motorized position stage
- -35 °C - 250 °C sample temperature control
- capable of scanning in fluid
Tool Specs
Manufacturer | Bruker |
---|---|
Model | Dimension Icon |
Location | 7130 |
Related Documents | Standard Operating Procedure |
Contact | info@4dlabs.ca |
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