file

A to Z Equipment list

P

Particle Size Analysis
  • measure of particle size distribution
  • capable of measuring particles down to 2 nm in diameter
Photoemission and Low Energy Electron Microscopy

Photolithography
  • positive and negative tone resist processing
  • deep UV, i-line and g-line exposure
  • mask-to-wafer alignment capabilities
  • contact and non-contact modes of exposure
Physical Vapour Deposition
  • DC/RF sputtering
  • electron beam deposition
  • thermal evaporators
  • materials include metals, oxides, and semiconductors (contact us for further details)
  • capabilities include deposition of alloys and multilayered films

R

Rapid Thermal Processing
  • programmable heating
  • oxidation, inert gas, and forming gas processes
Robotic Lithography Tool
  • class 1 environment available
  • multilayer process capabilities
  • complex programs possible
    • processes include material deposition, exposure, and developing