A
Atomic Force Microscopy
- mapping of physical topography
- localized measure of electrostatic and magnetic forces
- analysis of work function differences
- electrical characterization of nano-scale features
Auger Electron Spectroscopy
- surface sensitive elemental distribution maps
- capable of depth profiling using ion sputtering
- physical imaging of a surface
B
Bulk Crystal Growth
- single crystal growth
- materials include ferroelectrics
C
Chemical Vapour Deposition
- thermal process furnaces
- poly-silicon deposition
- silicon oxide growth
- silicon nitride deposition
- diffusion furnace
- n-type semiconductor doping
- plasma enhanced deposition
- silicon oxides and silicon nitrides growth
- low temperature deposition
Contact Angle Goniometer
- measure of interfacial energies
- dynamic contact angle analysis
- capable of automated measurements
