Analytical Capabilities
- Scanning Electron Microscopy
- imaging of physical surface structures
- rapid elemental imaging
- chemical analysis
- Transmission Electron Microscopy
- elemental analysis
- analysis of nanoscale crystalline materials
- high resolution imaging of crystalline lattices
- Photoemission and Low Energy Electron Microscopy
- Scanning Probe Microscopy
- Scanning Tunneling Microscopy
- Atomic Force Microscopy
- mapping of physical topography
- localized measure of electrostatic and magnetic forces
- analysis of work function differences
- electrical characterization of nano-scale features
- Near-field Scanning Optical Microscopy
- localized optical absorption measurements
- nano-scale optical emission
- Optical Microscopy
- reflection and transmission modes of imaging
- fluorescence imaging
- temperature dependent imaging
- X-Ray Photoelectron Spectroscopy
- chemical state and bonding information
- quantitative information
- elemental mapping of surfaces
- Auger Electron Spectroscopy
- surface sensitive elemental distribution maps
- capable of depth profiling using ion sputtering
- physical imaging of a surface
- Ion Scattering Spectroscopy
- Surface sensitive spectroscopy
- complimentary information to SIMS
- Secondary Ion Mass Spectroscopy
- chemical analysis of surfaces by ion sputtering
- depth profiling of composition
- Energy Dispersive X-Ray Spectroscopy
- elemental mapping of thin films and nanostructures
- semi-quantitative analysis
- Electron Energy Loss Spectroscopy
- atomic composition measurements
- chemical bonding and oxidation state information
- valence and conduction band electronic properties
- Surface Plasmon Resonance Spectroscopy
- measure of changes in surface dielectric layers on gold
- dynamic measure of adsorption and desorption rates from surfaces
- Optical Spectroscopy
- Spectroscopic Ellipsometry
- analysis of refractive index and dielectric constant of thin films
- film thickness measurements
- non-destructive technique
- Particle Size Analysis
- measure of particle size distribution
- capable of measuring particles down to 2 nm in diameter
- X-ray Diffraction
- crystallinity and phase composition determination
- size determination of crystallites
- polycrystalline and single crystalline samples
- analysis of thin films, bulk solids, or powders
- Surface Profilemetry
- physical measure of topography
- analysis of nano- to micron-scale thicknesses
- Microcalorimetry
- Thin Film Stress Analysis
- measure of stress in CVD and PVD grown films
- Contact Angle Goniometer
- measure of interfacial energies
- dynamic contact angle analysis
- capable of automated measurements
- SQUID (Superconducting Quantum Interference Device)
- magneto-resistance measurement capabilities
- variable temperature analysis (1.8 to 800 K)
- capable of AC mode measurements
- optional optical illumination of samples
- MOKE (Magneto-Optic Kerr Effect measurement system)
